Home / News &
Events / Reliability Assurance Analysis Using S-PLUS Improves Product Design Decisions For Leading Manufacturers
Reliability Assurance Analysis Using S-PLUS Improves Product Design Decisions For Leading Manufacturers
Speaker: William Q. Meeker, Professor of Statistics
and Distinguished Professor of Liberal Arts and Sciences,
Iowa State University
Presented: December 10th, 2003 at 11:00 EST
Download related information
referenced in the webcast:
Abstract
Reliability assurance processes in manufacturing industries
require data-driven information for making product-design
decisions. Life tests, accelerated life tests, and accelerated
degradation tests are commonly used to collect reliability
data. Data from products in the field provide another
important source of useful reliability information. Due
to complications like censoring, these reliability studies
typically yield data that require special statistical
methods. This presentation will describe the analyses
of five different life data analysis applications in the
area of product reliability. Methods used in the analyses
include Weibull and lognormal analysis, analysis of data
with multiple failure modes, accelerated test analysis,
and the analysis of recurrence data from repairable systems.
SPLIDA, a library for S-PLUS created by the presenter,
will be used for the analysis, and information on how
to obtain SPLIDA will be provided during the presentation.
Also, David Smith, Product Manager at Insightful Corporation,
will share the exciting new features in S-PLUS 6.2!
Presenter Information
William Meeker is Professor of Statistics and Distinguished
Professor of Liberal Arts and Sciences at Iowa State University.
He holds a BS from Clarkson University and MS and Ph.D.
degrees from Union College. His interests are in the areas
of reliability data analysis, statistical methods for
quality improvement, statistical planning and inference,
and statistical computing. He has worked 8 summers at
the General Electric Corporate Research and Development
Center and 15 summers at AT\&T Bell Laboratories and
provides consulting services for numerous other companies
and government agencies. He is a Fellow of the American
Statistical Association and an elected member of the International
Statistics Institute. Meeker is a former editor of Technometrics
and is currently an Associate Editor for Life Time Data
Analysis. He has won the American Statistical Association
Award for the Best Application paper, the American Society
for Quality (ASQ) Wilcoxon Prize three times and also
the ASQ Youden prize four times. He has won two awards
for outstanding teaching at Iowa State University. He
is the co-author of two books: Statistical Intervals (1991)
and Statistical Methods for Reliability Data (1998), both
published by John Wiley and Sons. He has also written
five book chapters and has numerous publications in the
engineering and statistical literature. He developed the
SPLIDA (S-PLUS life data analysis) collection of procedures
and other software packages.
|
