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Home / News & Events / Using Simulation and Graphics as an Aid in Planning Complicated Experiments

Using Simulation and Graphics as an Aid in Planning Complicated Experiments

Presented: Thursday, April 5th, 2007

Speaker: Dr. William Meeker, Iowa State University

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The combination of Monte Carlo simulation and graphics provides powerful tools for helping to plan complicated experiments. Although the ideas apply more generally, this talk will describe a collection of methods and procedures that have been developed for planning engineering reliability experiments. Such experiments include life tests, accelerated life tests, repeated measures degradation tests, and accelerated destructive degradation tests. The design of such reliability experiments typically requires answering questions about sample size, length of the test and, for accelerated tests, allocation of test units to different levels of the accelerating variable(s). Models for the data from such experiments must accommodate complications such as random effects, nonlinear estimation, and censoring. As such, standard experimental design tools need to be extended. I will describe methods that employ graphical displays for combinations of large-sample approximations for precision metrics and for the display of simulation results. Simulation will be shown to be a particularly versatile and valuable tool for providing insights into such complicated experimental design problems.


Bill MeekerDr. William Meeker, Iowa State University

Dr. Bill Meeker is the esteemed author of the book Statistical Methods for Reliability Data, which was recognized by the Association of American Publishers Professional/Scholarly Publishing Division Award for Excellence and Innovation in Engineering.

Bill is also a Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He holds a BS from Clarkson University and MS and Ph.D. degrees from Union College. He has consulted extensively on problems in reliability data analysis, reliability test planning, accelerated testing, and statistical computing for companies such as ATT Bell Laboratories, General Electric Corporate Research and Development, Hewlett Packard, and the Ford Motor Company.

He is a Fellow of the American Statistical Association and the American Society for Quality and a past Editor of Technometrics. He is currently an Associate Editor for the journal Life Data Analysis. He has won the American Society for Quality (ASQ) Youden prize four times and the ASQ Wilcoxon Prize three times. He is the co-author of three books, three book chapters, and of numerous publications in the engineering and statistical literature.